iA1189S Hall-effect sensor is a temperature stable, stress-resistant sensor. Superior hightemperature performance is made possible through a dynamic offset cancellation that utilizes chopperstabilization. This method reduces the offset voltage normally caused by device over molding, temperature dependencies, and thermal stress.
iA1189S includes the following on a single silicon chip: voltage regulator, Hall voltage generator, small-signal amplifier, chopper stabilization, Schmitt trigger. Advanced CMOS wafer fabrication processing is used to take advantage of low-voltage requirements, component matching, very low input-offset errors, and small component geometries.